Interoperability Test Center

(65) 6747 7234
sales@tmesystems.net
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Interoperability Test Center

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The best-in-class software for comprehensive data analysis with COMPRION test systems

  • Records, displays, and analyzes communication between smart card and terminal
  • Signal analysis with integrated oscilloscope
  • Monitoring and logfile generation
  • Outstanding graphical user interface
     

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Product Overview

COMPRION Interoperability Test Center is mainly used for:

 

  • Interoperability testing (smart card/terminal for contact-based and contactless interfaces)
  • Development/debugging of
    • mobile phones/chipsets
    • smart cards
    • M2M devices
    • NFC-enabled devices, contactless terminals/readers and front-ends (CLFs)
    • NFC applications
    • contactless cards
    • RFID tags
  • Visualization and measurement of analog signals
  • Combined NFC/SWP/HCI testing
  • Quality assurance
  • Simultaneous test and analysis of UICC interfaces (ISO/IEC 7816, SWP/HCI, IC-USB) and contactless (NFC) interfaces
  • Field testing (mobile usage)