Webinar: I3C Application Layer Testing and Conformance
Join Our Webinar!
Date: 13 Jan 2026, Tuesday
Time: India 1.00pm IST I Europe 8.30am CET I Singapore 3.30pm SGT
Japan/Korea 4.30pm JST/KST I Singapore 3.30pm SGT
Introduction
MIPI I3C® protocol adoption is growing across multiple use cases. It is now used in mobile, automotive, storage, optical communication, camera serial interfaces (CSI), PCIe Gen5 and Gen6, and general purpose interfaces. MIPI I3C®is rapidly replacing legacy interfaces such as I2C, SPI and UART.
To support these diverse use cases, several application layer protocols have been integrated with the MIPI I3C® protocol. Management Control Transport Protocol (MCTP as a transport layer), NVMe Management Interface (NVMe-MI), Security Protocol and Data Model (SPDM) and Platform Level Data Model (PLDM) are now key components of system level communication. To ensure these protocols interoperate reliably, industry associates have developed conformance test suites (CTS) that help designers validate protocol behavior in a system.
Agenda
- I3C technology overview and adoption trends
- Application layer protocols: MCTP, NVMe-MI, SPDM, and PLDM
- I3C conformance and interoperability testing
- PGY-I3C-EX-PD live demonstration
About the Webinar
Prodigy Technovations, leaders in MIPI I3C® test and measurement, has enhanced the PGY-I3C-EX-PD-Protocol Exerciser and Analyzer to support MCTP, NVMe-MI, SPDM and PLDM Protocol Exerciser and Analyzer capabilities along with corresponding conformance test suites.
Developers can configure PGY-I3C-EX-PD as a controller or target and write custom test scripts to validate devices under test across different application layer protocols in addition to the MIPI I3C® protocol. The available conformance suites for MCTP, NVMe-MI and SPDM enable comprehensive interoperability testing.
In this webinar, we will provide an overview of these application layer protocols and demonstrate live testing of DUTs across different layers along with the conformance test suite.
Speaker
Godfree Coelho
Godfree has 25+ years of experience in the test and measurement industry, including 15 years at Tektronix/HP/Agilent. As a product manager, he defined the product roadmap for power measurement solutions at Tektronix, launched power measurement software, and co-authored three patents. Since 2009, he has successfully implemented strategies at Prodigy Technovations, securing top 10 semiconductor companies as customers. He holds a B.E. in Electronics and Communication from Mysore University and a postgraduate business management degree from XLRI Jamshedpur.